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http://bura.brunel.ac.uk/handle/2438/8769| Title: | The effect of protons on the performance of swept-charge devices |
| Authors: | Smith, DR Gow, J |
| Keywords: | Radiation damage;Proton;Swept-charge device;SCD;XRF |
| Issue Date: | 2009 |
| Publisher: | Elsevier |
| Citation: | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 604(1-2), 177 - 179, 2009 |
| Abstract: | The e2v technologies CCD54, or swept-charge device (SCD) has been extensively radiation tested for use in the Chandrayaan-1 X-ray Spectrometer (C1XS) instrument, to be launched as a part of the Indian Space Research Organisation (ISRO) Chandrayaan-1 payload in 2008. The principle use of the SCD is in X-ray fluorescence (XRF) applications, the device providing a relatively large collecting area of 1.1 cm2, and achieving near Fano-limited spectroscopy at −15 °C, a temperature that is easily obtained using a thermoelectric cooler (TEC). This paper describes the structure and operation of the SCD and details the methodology and results obtained from two proton irradiation studies carried out in 2006 and 2008, respectively to quantify the effects of proton irradiation on the operational characteristics of the device. The analysis concentrates on the degradation of the measured FWHM of various elemental lines and quantifies the effects of proton fluence on the observed X-ray fluorescence spectra from mineralogical target samples. |
| Description: | This is the pre-print version of the final paper published in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. The published article is available from the link below. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. Copyright @ 2009 Elsevier B.V. |
| URI: | http://www.sciencedirect.com/science/article/pii/S0168900209001466 http://bura.brunel.ac.uk/handle/2438/8769 |
| DOI: | http://dx.doi.org/10.1016/j.nima.2009.01.051 |
| ISSN: | 0168-9002 |
| Appears in Collections: | Electronic and Computer Engineering Dept of Electronic and Electrical Engineering Research Papers |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Fulltext.pdf | 185.76 kB | Adobe PDF | View/Open |
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