Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/8769
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dc.contributor.authorSmith, DR-
dc.contributor.authorGow, J-
dc.date.accessioned2014-07-28T09:43:37Z-
dc.date.available2014-07-28T09:43:37Z-
dc.date.issued2009-
dc.identifier.citationNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 604(1-2), 177 - 179, 2009en_US
dc.identifier.issn0168-9002-
dc.identifier.urihttp://www.sciencedirect.com/science/article/pii/S0168900209001466en
dc.identifier.urihttp://bura.brunel.ac.uk/handle/2438/8769-
dc.descriptionThis is the pre-print version of the final paper published in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. The published article is available from the link below. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. Copyright @ 2009 Elsevier B.V.en_US
dc.description.abstractThe e2v technologies CCD54, or swept-charge device (SCD) has been extensively radiation tested for use in the Chandrayaan-1 X-ray Spectrometer (C1XS) instrument, to be launched as a part of the Indian Space Research Organisation (ISRO) Chandrayaan-1 payload in 2008. The principle use of the SCD is in X-ray fluorescence (XRF) applications, the device providing a relatively large collecting area of 1.1 cm2, and achieving near Fano-limited spectroscopy at −15 °C, a temperature that is easily obtained using a thermoelectric cooler (TEC). This paper describes the structure and operation of the SCD and details the methodology and results obtained from two proton irradiation studies carried out in 2006 and 2008, respectively to quantify the effects of proton irradiation on the operational characteristics of the device. The analysis concentrates on the degradation of the measured FWHM of various elemental lines and quantifies the effects of proton fluence on the observed X-ray fluorescence spectra from mineralogical target samples.en_US
dc.languageEnglish-
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.subjectRadiation damageen_US
dc.subjectProtonen_US
dc.subjectSwept-charge deviceen_US
dc.subjectSCDen_US
dc.subjectXRFen_US
dc.titleThe effect of protons on the performance of swept-charge devicesen_US
dc.typeArticleen_US
dc.identifier.doihttp://dx.doi.org/10.1016/j.nima.2009.01.051-
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Appears in Collections:Electronic and Computer Engineering
Dept of Electronic and Electrical Engineering Research Papers

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