Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/27885
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dc.contributor.authorChakrabartty, SN-
dc.contributor.authorWang, K-
dc.contributor.authorChakrabarty, D-
dc.date.accessioned2023-12-19T13:45:48Z-
dc.date.available2023-12-19T13:45:48Z-
dc.date.issued2024-03-19-
dc.identifierORCiD: Dalia Chakrabarty https://orcid.org/0000-0003-1246-4235-
dc.identifier4-
dc.identifier.citationChakrabartty, S.N., Wang, K. and Chakrabarty, D. (2024) 'Reliable uncertainties of tests and surveys – a data-driven approach', International Journal of Metrology and Quality Engineering, 15, 4,.pp. 1 - 14. doi: 10.1051/ijmqe/2023018.en_US
dc.identifier.issn2107-6839-
dc.identifier.urihttps://bura.brunel.ac.uk/handle/2438/27885-
dc.descriptionMSC Classification 60J10, 91Exx, 91E45, 05A18.en_US
dc.descriptionSupplementary material are available online at: https://www.metrology-journal.org/10.1051/ijmqe/2023018/olm . The article is accompanied by supplementary information that includes proofs to the theorems that are stated within the text of the article; linking our advanced methods to extant congeneric methods in the literature; comparison of the methods discussed herein, for partitioning a set of integers into 2 subsets and presentation of results on simulated data.-
dc.description.abstractPolicy decisions are often motivated by results attained by a cohort of responders to a survey or a test. However, erroneous identification of the reliability or the complimentary uncertainty of the test/survey instrument, will distort the data that such policy decisions are based upon. Thus, robust learning of the uncertainty of such an instrument is sought. This uncertainty is parametrised by the departure from reproducibility of the data comprising responses to questions of this instrument, given the responders. Such departure is best modelled using the distance between the data on responses to questions that comprise the two similar subtests that the given test/survey can be split into. The paper presents three fast and robust ways for learning the optimal-subtests that a given test/survey instrument can be spilt into, to allow for reliable uncertainty of the given instrument, where the response to a question is either binary, or categorical − taking values at multiple levels − and the test/survey instrument is realistically heterogeneous in the correlation structure of the questions (or items); prone to measuring multiple traits; and built of small to a very large number of items. Our methods work in the presence of such messiness of real tests and surveys that typically violate applicability of conventional methods. We illustrate our new methods, by computing uncertainty of three real tests and surveys that are large to very-large in size, subsequent to learning the optimal subtests.en_US
dc.description.sponsorshipThere is no funding to be reported.en_US
dc.format.extent1 - 14-
dc.format.mediumPrint-Electronic-
dc.language.isoenen_US
dc.publisherEDP Sciences-
dc.relation.urihttps://www.metrology-journal.org/10.1051/ijmqe/2023018/olm-
dc.rightsCopyright © S.N. Chakrabartty et al., Published by EDP Sciences, 2024. This is an Open Access article distributed under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.-
dc.rights.urihttps://creativecommons.org/licenses/by/4.0-
dc.subjectMarkov chains (discrete-time Markov processes on discrete state spaces)en_US
dc.subjectmathematical psychologyen_US
dc.subjectmeasurement and performanceen_US
dc.subjectpartitions of setsen_US
dc.titleReliable uncertainties of tests and surveys – a data-driven approachen_US
dc.typeArticleen_US
dc.identifier.doihttps://doi.org/10.1051/ijmqe/2023018-
dc.relation.isPartOfInternational Journal of Metrology and Quality Engineering-
pubs.publication-statusPublished-
pubs.volume15-
dc.identifier.eissn2107-6847-
dc.rights.licensehttps://creativecommons.org/licenses/by/4.0/legalcode.en-
dc.rights.holderS.N. Chakrabartty et al.-
Appears in Collections:Dept of Mathematics Research Papers

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