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Please use this identifier to cite or link to this item:
http://bura.brunel.ac.uk/handle/2438/18013| Title: | Electromagnetic Metrology for Nano-Electromechanical Systems |
| Authors: | Hao, L Gallop, JC Chen, J |
| Keywords: | 2-D materials;electrical conductivity;graphene;nano-electromechanical system (NEMS) resonator;nanoscale electromagnetic metrology;noncontacting scanning microwave microscope (NSMM);microwave |
| Issue Date: | 2018 |
| Publisher: | IEEE |
| Citation: | IEEE Transactions on Instrumentation and Measurement |
| Description: | © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
| URI: | https://bura.brunel.ac.uk/handle/2438/18013 |
| DOI: | https://doi.org/10.1109/TIM.2018.2879068 |
| ISSN: | 0018-9456 |
| Appears in Collections: | Dept of Mechanical and Aerospace Engineering Research Papers |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| FullText.pdf | 1.01 MB | Adobe PDF | View/Open |
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