Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/18013
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dc.contributor.authorHao, L-
dc.contributor.authorGallop, JC-
dc.contributor.authorChen, J-
dc.date.accessioned2019-05-07T17:17:04Z-
dc.date.available2019-05-07T17:17:04Z-
dc.date.issued2018-
dc.identifier.citationIEEE Transactions on Instrumentation and Measurementen_US
dc.identifier.issn0018-9456-
dc.identifier.urihttps://bura.brunel.ac.uk/handle/2438/18013-
dc.description© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.-
dc.description.sponsorshipThis work was supported in part by the U.K. NMS Programme and in part by EPSRC.-
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subject2-D materialsen_US
dc.subjectelectrical conductivityen_US
dc.subjectgrapheneen_US
dc.subjectnano-electromechanical system (NEMS) resonatoren_US
dc.subjectnanoscale electromagnetic metrologyen_US
dc.subjectnoncontacting scanning microwave microscope (NSMM)en_US
dc.subjectmicrowave-
dc.titleElectromagnetic Metrology for Nano-Electromechanical Systemsen_US
dc.typeArticleen_US
dc.identifier.doihttps://doi.org/10.1109/TIM.2018.2879068-
dc.relation.isPartOfIEEE Transactions on Instrumentation and Measurement-
pubs.publication-statusPublished-
dc.identifier.eissn1557-9662-
Appears in Collections:Dept of Mechanical and Aerospace Engineering Research Papers

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