Brunel University Research Archive(BURA) preserves and enables easy and open access to all
types of digital content. It showcases Brunel's research outputs.
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Browsing by Author Abu Ebayyeh, AARM
Showing results 1 to 5 of 5
| Issue Date | Title | Author(s) |
|---|---|---|
| 22-Aug-2022 | Defect detection on optoelectronical devices to assist decision making: A real industry 4.0 case study | Moustris, GP; Kouzas, G; Fourakis, S; Fiotakis, G; Chondronasios, A; Abu Ebayyeh, AARM; Mousavi, A; Apostolou, K; Milenkovic, J; Chatzichristodoulou, Z; Beckert, E; Butet, J; Blaser, S; Landry, O; Müller, A |
| 10-Dec-2021 | An Improved Capsule Network (WaferCaps) for Wafer Bin Map Classification Based on DCGAN Data Upsampling | Abu Ebayyeh, AARM; Danishvar, S; Mousavi, A |
| 25-Oct-2022 | Printed Circuit Board Inspection: Fusion of Optical and X-ray Images (FOXi) for Electronic Components Classification | Starodubov, D; Danishvar, S; Ott, R; Abu Ebayyeh, AARM; Cummings, N; Mousavi, A |
| 6-Oct-2020 | A Review and Analysis of Automatic Optical Inspection and Quality Monitoring Methods in Electronics Industry | Abu Ebayyeh, AARM; Mousavi, A |
| 11-Aug-2022 | Waveguide quality inspection in quantum cascade lasers: A capsule neural network approach | Abu Ebayyeh, AARM; Mousavi, A; Danishvar, S; Blaser, S; Gresch, T; Landry, O; Müller, A |