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Issue Date | Title | Author(s) |
---|---|---|
3-Feb-2021 | Industry 4.0: Why Machine Learning Matters? | Gan, TH; Kanfoud, J; Nedunuri, H; Amini, A; Feng, G |
22-Aug-2022 | Defect detection on optoelectronical devices to assist decision making: A real industry 4.0 case study | Moustris, GP; Kouzas, G; Fourakis, S; Fiotakis, G; Chondronasios, A; Abu Ebayyeh, AARM; Mousavi, A; Apostolou, K; Milenkovic, J; Chatzichristodoulou, Z; Beckert, E; Butet, J; Blaser, S; Landry, O; Müller, A |
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