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Issue DateTitleAuthor(s)
3-Feb-2021Industry 4.0: Why Machine Learning Matters?Gan, TH; Kanfoud, J; Nedunuri, H; Amini, A; Feng, G
22-Aug-2022Defect detection on optoelectronical devices to assist decision making: A real industry 4.0 case studyMoustris, GP; Kouzas, G; Fourakis, S; Fiotakis, G; Chondronasios, A; Abu Ebayyeh, AARM; Mousavi, A; Apostolou, K; Milenkovic, J; Chatzichristodoulou, Z; Beckert, E; Butet, J; Blaser, S; Landry, O; Müller, A