Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/8523
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dc.contributor.authorMajidnia, S-
dc.contributor.authorRudlin, J-
dc.contributor.authorNilavalan, R-
dc.date.accessioned2014-05-30T09:56:30Z-
dc.date.available2014-05-30T09:56:30Z-
dc.date.issued2012-
dc.identifier.citation51st Annual Conference of the British Institute of Non-Destructive Testing, Daventry, UK, 11 - 13 September 2012en_US
dc.identifier.urihttp://bura.brunel.ac.uk/handle/2438/8523-
dc.identifier.urihttp://www.bindt.org/downloads/ndt2012_6a2.pdfen
dc.description.abstractThe simple depth of penetration equation used for most eddy current calculations does not take into account the effect of the size of the coil or the effect of flaw morphology. The work described in this paper describes use of the CIVA eddy current model to investigate this effect and some experimental investigations. Knowledge of this effect is important in examination of thin sections with eddy currents. Two examples of this are the small sections required to be inspected in laser metal deposition, and welds in thin sections joining dissimilar metals such as copper and aluminium for electrical connections.en_US
dc.language.isoenen_US
dc.publisherBritish Institute of Non-Destructive Testingen_US
dc.subjectDepth of penetration equationen_US
dc.subjectEddy currentsen_US
dc.subjectLaser metal depositionen_US
dc.subjectCopperen_US
dc.subjectAluminiumen_US
dc.titleDepth of penetration effects in eddy current testingen_US
dc.typeConference Paperen_US
pubs.organisational-data/Brunel-
pubs.organisational-data/Brunel/Brunel Active Staff-
pubs.organisational-data/Brunel/Brunel Active Staff/School of Engineering & Design-
pubs.organisational-data/Brunel/Brunel Active Staff/School of Engineering & Design/Electronic and Computer Engineering-
pubs.organisational-data/Brunel/University Research Centres and Groups-
pubs.organisational-data/Brunel/University Research Centres and Groups/School of Engineering and Design - URCs and Groups-
pubs.organisational-data/Brunel/University Research Centres and Groups/School of Engineering and Design - URCs and Groups/Wireless Networks and Communications Centre-
Appears in Collections:Electronic and Computer Engineering
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Dept of Electronic and Electrical Engineering Research Papers

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