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http://bura.brunel.ac.uk/handle/2438/28901Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Godfrey, T | - |
| dc.contributor.author | Long, G | - |
| dc.contributor.author | Gallop, J | - |
| dc.contributor.author | Cox, D | - |
| dc.contributor.author | Polychroniou, E | - |
| dc.contributor.author | Chen, J | - |
| dc.contributor.author | Romans, E | - |
| dc.contributor.author | Hao, L | - |
| dc.date.accessioned | 2024-05-01T09:22:47Z | - |
| dc.date.available | 2024-05-01T09:22:47Z | - |
| dc.date.issued | 2020-05-28 | - |
| dc.identifier | ORCiD: Tom Godfrey https://orcid.org/0000-0002-0453-8460 | - |
| dc.identifier | ORCiD: George Long https://orcid.org/0000-0002-1787-9539 | - |
| dc.identifier | ORCiD: John Gallop https://orcid.org/0000-0001-6303-6033 | - |
| dc.identifier | ORCiD: Jie Chen https://orcid.org/0000-0001-7532-1536 | - |
| dc.identifier | 1601104 | - |
| dc.identifier.citation | Godfrey, T. et al. (2020) 'Microwave Inductive Readout of EBL Nanobridge SQUIDs', IEEE Transactions on Applied Superconductivity, 30 (7), 1601104, pp. 1 - 4. doi: 10.1109/TASC.2020.2998374. | en_US |
| dc.identifier.issn | 1051-8223 | - |
| dc.identifier.uri | https://bura.brunel.ac.uk/handle/2438/28901 | - |
| dc.description.abstract | Niobium-based nanobridge superconducting quantum interference devices (SQUIDs) have shown very low noise performance and high-frequency operation. We describe how we are bringing together these two aspects of nanobridge SQUIDs with the aim of realizing single spin-flip detection using microwave inductive readout techniques, where the nanobridge SQUID is integrated into a superconducting coplanar waveguide resonator. Using electron beam lithography (EBL) is ideal for fabricating nanobridge junctions and has the advantage of being easily scalable compared to using a focused ion beam. In this article, we demonstrate that EBL is suitable for fabricating nanobridge junction SQUIDs, and they exhibit very comparable performance to previous focused ion beam milled SQUIDs. Our integrated devices show potential to be used for flux-tunable sensors. | en_US |
| dc.description.sponsorship | UK NMS Programme and UCL & NPL Impact Studentship. | en_US |
| dc.format.extent | 1 - 4 | - |
| dc.language | English | - |
| dc.language.iso | en_US | en_US |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
| dc.rights | Copyright © 2020 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works (see: https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/). | - |
| dc.rights.uri | https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/ | - |
| dc.subject | electron beam lithography (EBL) | en_US |
| dc.subject | focused ion beam | en_US |
| dc.subject | nanoscale | en_US |
| dc.subject | nanobridge superconducting quantum interference devices (nanoSQUIDs) | en_US |
| dc.subject | SQUIDs | en_US |
| dc.subject | superconducting microwave devices | en_US |
| dc.title | Microwave Inductive Readout of EBL Nanobridge SQUIDs | en_US |
| dc.type | Article | en_US |
| dc.identifier.doi | https://doi.org/10.1109/TASC.2020.2998374 | - |
| dc.relation.isPartOf | IEEE Transactions on Applied Superconductivity | - |
| pubs.issue | 7 | - |
| pubs.publication-status | Published | - |
| pubs.volume | 30 | - |
| dc.identifier.eissn | 1558-2515 | - |
| dc.rights.holder | Institute of Electrical and Electronics Engineers (IEEE) | - |
| Appears in Collections: | Dept of Mechanical and Aerospace Engineering Research Papers | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| FullText.pdf | Copyright © 2020 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works (see: https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/). | 4.92 MB | Adobe PDF | View/Open |
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