Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/28063
Full metadata record
DC FieldValueLanguage
dc.contributor.authorBharti, P-
dc.contributor.authorYang, Q-
dc.contributor.authorForbes, A-
dc.contributor.authorRomanchikova, M-
dc.contributor.authorHippolyte, J-L-
dc.coverage.spatialYokohama, Japan (virtual)-
dc.date.accessioned2024-01-20T14:35:08Z-
dc.date.available2024-01-20T14:35:08Z-
dc.date.issued2021-09-22-
dc.identifierORCID iD: Qingping Yang https://orcid.org/0000-0002-2557-8752-
dc.identifier.citationBharti, P. et al. (2021) 'Ontology development for measurement process and uncertainty of results', Measurement: Sensors, 18, 100325, pp. 1 - 4. doi: 10.1016/j.measen.2021.100325.en_US
dc.identifier.urihttps://bura.brunel.ac.uk/handle/2438/28063-
dc.description.abstractCopyright © The Author(s) 2021. In future manufacturing and metrology, there is increasing demand to organize relevant metadata and knowledge to present information in semantically meaningful, reusable, easily accessible, and interoperable form. Up-to-date information on measurement uncertainty is key to interpretation of measurement results and to assessment of the quality of the measurement process. Although various technologies from knowledge engineering have been proposed to fulfil this requirement, previous work has not fully addressed the uncertainty during the measurement process. This paper presents the method to develop an ontology of the measurement process and the uncertainty of results on the example of coordinate measurements. The resulting ontology model based on a set of competency questions, including key concepts and relationships between them, is presented and discussed. The consistency of the ontology model is verified by inferencing rules and answering competency questions in Protégé software. The presented ontology will find wide applications in metrology and Industry 4.0.en_US
dc.format.extent100325 - 100325 (4)-
dc.format.mediumElectronic-
dc.languageEnglish-
dc.language.isoen_USen_US
dc.publisherElsevieren_US
dc.rightsCopyright © The Author(s) 2021. Published by Elsevier. Author retains all rights CC BY. This work is licensed under a Creative Commons Attribution 4.0 International License (https://creativecommons.org/licenses/by/4.0/).-
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/-
dc.sourceWorld Congress of the International Measurement Confederation-
dc.sourceWorld Congress of the International Measurement Confederation-
dc.titleOntology development for measurement process and uncertainty of resultsen_US
dc.typeArticleen_US
dc.identifier.doihttps://doi.org/10.1016/j.measen.2021.100325-
dc.relation.isPartOfMeasurement: Sensors-
pubs.finish-date2021-09-03-
pubs.finish-date2021-09-03-
pubs.publication-statusPublished-
pubs.start-date2021-08-30-
pubs.start-date2021-08-30-
pubs.volume18-
dc.identifier.eissn2665-9174-
dc.rights.holderThe Author(s)-
Appears in Collections:Dept of Mechanical and Aerospace Engineering Research Papers

Files in This Item:
File Description SizeFormat 
FullText.pdfCopyright © The Author(s) 2021. Published by Elsevier. Author retains all rights CC BY. This work is licensed under a Creative Commons Attribution 4.0 International License (https://creativecommons.org/licenses/by/4.0/).2.37 MBAdobe PDFView/Open


This item is licensed under a Creative Commons License Creative Commons