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DC Field | Value | Language |
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dc.contributor.author | Mahini, R | - |
dc.contributor.author | Xu, P | - |
dc.contributor.author | Chen, G | - |
dc.contributor.author | Li, Y | - |
dc.contributor.author | Ding, W | - |
dc.contributor.author | Zhang, L | - |
dc.contributor.author | Qureshi, NK | - |
dc.contributor.author | Hämäläinen, T | - |
dc.contributor.author | Nandi, AK | - |
dc.contributor.author | Cong, F | - |
dc.date.accessioned | 2023-01-04T16:52:48Z | - |
dc.date.available | 2023-01-04T16:52:48Z | - |
dc.date.issued | 2022-07-18 | - |
dc.identifier.citation | Mahini, R. et al. (2022) 'Optimal Number of Clusters by Measuring Similarity Among Topographies for Spatio-Temporal ERP Analysis', Brain Topography, 35 (5-6), pp. 537 - 557. doi: 10.1007/s10548-022-00903-2. | en_US |
dc.identifier.issn | 0896-0267 | - |
dc.identifier.uri | https://bura.brunel.ac.uk/handle/2438/25715 | - |
dc.description | Data Availability: The datasets analyzed in this article are not publicly available. Requests to access the datasets should be directed to Guoliang Chen. | en_US |
dc.description | A Correction to this article was published on 01 October 2022 at https://link.springer.com/article/10.1007/s10548-022-00918-9. The correction is as follows: "The original version of the article unfortunately contained a mistake. In “Materials and Methods” section, under the subheading “Simulated ERP Data”, the year 2006 which presented in the third line of the first paragraph should be removed. That is, the correct sentence should read as below, In order to validate the proposed methodology, simulated data was conducted using the BESA dipole simulator (https://www.besa.de/products/besa-simulator/besa-simulator-overview/) The original article has been corrected." | - |
dc.description.sponsorship | National Natural Science Foundation of China (Grant No. 91748105); National Foundation in China (Nos.. JCKY2019110B009 & 2020-JCJQ-JJ-252); Fundamental Research Funds for the Central Universities [DUT2019] in Dalian University of Technology in China. | en_US |
dc.format.extent | 537 - 557 | - |
dc.format.medium | Print-Electronic | - |
dc.language | English | - |
dc.language.iso | en_US | en_US |
dc.publisher | Springer Nature | en_US |
dc.rights | Copyright © The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2022. This version of the article has been accepted for publication, after peer review (when applicable) and is subject to Springer Nature’s AM terms of use, but is not the Version of Record and does not reflect post-acceptance improvements, or any corrections. The Version of Record is available online at: https://doi.org/10.1007/s10548-022-00903-2 | - |
dc.rights.uri | https://www.springernature.com/gp/open-research/policies/journal-policies | - |
dc.subject | event-related potentials | en_US |
dc.subject | optimal number of clusters | en_US |
dc.subject | topographical analysis | en_US |
dc.subject | time window | en_US |
dc.subject | microstates | en_US |
dc.subject | consensus clusterin | en_US |
dc.title | Optimal Number of Clusters by Measuring Similarity Among Topographies for Spatio-Temporal ERP Analysis | en_US |
dc.type | Article | en_US |
dc.identifier.doi | https://doi.org/10.1007/s10548-022-00903-2 | - |
dc.relation.isPartOf | Brain Topography | - |
pubs.issue | 5-6 | - |
pubs.publication-status | Published | - |
pubs.volume | 35 | - |
dc.identifier.eissn | 1573-6792 | - |
dc.rights.holder | The Author(s) | - |
Appears in Collections: | Dept of Electronic and Electrical Engineering Research Papers |
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FullText.pdf | Copyright © The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2022. This version of the article has been accepted for publication, after peer review (when applicable) and is subject to Springer Nature’s AM terms of use, but is not the Version of Record and does not reflect post-acceptance improvements, or any corrections. The Version of Record is available online at: https://doi.org/10.1007/s10548-022-00903-2 | 2.23 MB | Adobe PDF | View/Open |
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