Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/24569
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dc.contributor.authorShen, Y-
dc.contributor.authorWang, Z-
dc.contributor.authorDong, H-
dc.date.accessioned2022-05-13T16:11:03Z-
dc.date.available2022-04-01-
dc.date.available2022-05-13T16:11:03Z-
dc.date.issued2022-04-01-
dc.identifier.citationY. Shen, Z. Wang and H. Dong, "Minimum-Variance State and Fault Estimation for Multirate Systems With Dynamical Bias," in IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 69, no. 4, pp. 2361-2365, April 2022, doi: 10.1109/TCSII.2022.3142094.en_US
dc.identifier.issn1549-7747-
dc.identifier.issn1558-3791-
dc.identifier.urihttp://bura.brunel.ac.uk/handle/2438/24569-
dc.description.abstractThis brief is concerned with the joint state and fault estimation problem for a class of multi-rate systems with dynamical bias. To reflect real practice, the multi-rate sampling is considered which allows the sensor sampling rate and the state update rate to be different. The sensor is subject to the sensor fault that changes according to a dynamic equation. Instead of applying the traditional lifting technique, we introduce a time-varying delay into the measurement equation so as to transform the multi-rate systems into single-rate ones. The aim of this brief is to develop a joint state and fault estimation algorithm with minimized estimation error covariance. The recursion of the estimation error covariance is first derived, and appropriate estimator gains are then characterized that minimizes the estimation error covariance. A simulation example on the DC servo system is given to confirm the usefulness of the developed recursive state and fault estimation algorithm.en_US
dc.format.extent2361 - 2365-
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.subjectFault estimationen_US
dc.subjectSensor faulten_US
dc.subjectMulti-rate samplingen_US
dc.subjectDynamical biasen_US
dc.titleMinimum-Variance State and Fault Estimation for Multirate Systems with Dynamical Biasen_US
dc.typeArticleen_US
dc.identifier.doihttp://dx.doi.org/10.1109/TCSII.2022.3142094-
dc.relation.isPartOfIEEE Transactions on Circuits and Systems II: Express Briefs-
pubs.issue4-
pubs.publication-statusPublished-
pubs.volume69-
dc.identifier.eissn1558-3791-
Appears in Collections:Dept of Computer Science Research Papers

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