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Please use this identifier to cite or link to this item:
http://bura.brunel.ac.uk/handle/2438/24450Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Qi, M | - |
| dc.contributor.author | Wang, Y | - |
| dc.contributor.author | Chen, Y | - |
| dc.contributor.author | Xin, H | - |
| dc.contributor.author | Xu, Y | - |
| dc.contributor.author | Meng, H | - |
| dc.contributor.author | Wang, A | - |
| dc.date.accessioned | 2022-04-15T15:53:00Z | - |
| dc.date.available | 2022-04-15T15:53:00Z | - |
| dc.date.issued | 2022-03-22 | - |
| dc.identifier | ORCID iD: | - |
| dc.identifier | 011002 | - |
| dc.identifier.citation | Qi, M., Wang, Y., Chen, Y., Xin, H., Xu, Y., Meng, H. and Wang, A. (2023) 'Center detection algorithm for printed circuit board circular marks based on image space and parameter space', Journal of Electronic Imaging, 32 (1), 011002, pp. 1-13. doi: 10.1117/1.jei.32.1.011002. | en_US |
| dc.identifier.issn | 1017-9909 | - |
| dc.identifier.uri | https://bura.brunel.ac.uk/handle/2438/24450 | - |
| dc.description.sponsorship | Key Project of Shaanxi Province Industrial Innovation Program, China (Grant No. 2017ZDCXL-GY-11-02-02). | en_US |
| dc.format.extent | 1 - 13 | - |
| dc.format.medium | Print-Electronic | - |
| dc.language.iso | en_US | en_US |
| dc.publisher | SPIE | en_US |
| dc.rights | Copyright © 2022 Society of Photo-Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited. | - |
| dc.rights.uri | https://www.spiedigitallibrary.org/article-sharing-policies | - |
| dc.subject | two-step optimization Hough transform | en_US |
| dc.subject | adaptive image preprocessing; | en_US |
| dc.subject | shape quality inspection | en_US |
| dc.subject | least-squares method | en_US |
| dc.title | Center detection algorithm for printed circuit board circular marks based on image space and parameter space | en_US |
| dc.type | Article | en_US |
| dc.identifier.doi | https://doi.org/10.1117/1.jei.32.1.011002 | - |
| dc.relation.isPartOf | Journal of Electronic Imaging | - |
| pubs.issue | 1 | - |
| pubs.publication-status | Published | - |
| pubs.volume | 32 | - |
| dc.identifier.eissn | 1560-229X | - |
| dc.rights.holder | Society of Photo-Optical Instrumentation Engineers (SPIE | - |
| Appears in Collections: | Dept of Electronic and Electrical Engineering Research Papers | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| FullText.pdf | Copyright © 2022 Society of Photo-Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited (see: https://www.spiedigitallibrary.org/article-sharing-policies). | 1.04 MB | Adobe PDF | View/Open |
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