Transient extraction transform based fault location method with enhanced accuracy

Abstract

The fast determination of internal or external fault for the VSC-MTDC is essential for its safety and continuous operation. As very limited time is permitted in an internal fault, transient-based protection elements are widely applied to locate the fault in a very small-time window. However, with such a short time window, location methods based on the wavelet transform or the mathematical morphology show limited performance balancing the resolution in the time and frequency domains. In recent years, there has been a novel time-frequency domain analysis method, naming the transient extraction transform (TET), with high accuracy in both domains. In this paper, a TET-based fast fault-location method is proposed with enhanced accuracy. Comparison studies are made to highlight the performance of such a method against internal faults for the VSC-MTDC.