Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/23837
Title: Residual Convolution LSTM Network for Machines Remaining Useful Life Prediction and Uncertainty Quantification
Authors: Wang, W
Lei, Y
Yan, T
Li, N
Nandi, AK
Keywords: deep learning;residual convolution LSTM network;remaining useful life prediction;uncertainty quantification
Issue Date: 20-Dec-2021
Publisher: Intelligence Science and Technology Press Inc.
Citation: Wang, W. et al. (2022) 'Residual Convolution LSTM Network for Machines Remaining Useful Life Prediction and Uncertainty Quantification', Journal of Dynamics, Monitoring and Diagnostics, 1 (1), pp. 2 - 8. doi: 10.37965/jdmd.v2i2.43.
Abstract: Copyright © 2021 The Author(s). Recently, deep learning is widely used in the field of remaining useful life (RUL) prediction. Among various deep learning technologies, recurrent neural network (RNN) and its variant, e.g., long short-term memory (LSTM) network, are gaining more attention because of their capability of capturing temporal dependence. Although the existing RNN-based approaches have demonstrated their RUL prediction effectiveness, they still suffer from the following two limitations: 1) it is difficult for RNN to extract directly degradation features from original monitoring data, and 2) most of the RNN-based prognostics methods are unable to quantify the uncertainty of prediction results. To address the above limitations, this paper proposes a new method named Residual convolution LSTM (RC-LSTM) network. In RC-LSTM, a new ResNet-based convolution LSTM (Res-ConvLSTM) layer is stacked with convolution LSTM (ConvLSTM) layer to extract degradation representations from monitoring data. Then, predicated on the RUL following a normal distribution, an appropriate output layer is constructed to quantify the uncertainty of the forecast result. Finally, the effectiveness and superiority of RC-LSTM is verified using monitoring data from accelerated degradation tests of rolling element bearings.
URI: https://bura.brunel.ac.uk/handle/2438/23837
DOI: https://doi.org/10.37965/jdmd.v2i2.43
ISSN: 2833-650X
Other Identifiers: ORCID iDs: Yaguo Lei https://orcid.org/0000-0002-5167-1459; Tao Yan https://orcid.org/0000-0002-3328-2118; Asoke Nandi https://orcid.org/0000-0001-6248-2875.
Appears in Collections:Dept of Electronic and Electrical Engineering Research Papers

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