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DC Field | Value | Language |
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dc.contributor.author | Ma, L | - |
dc.contributor.author | Wang, Z | - |
dc.contributor.author | Hu, J | - |
dc.contributor.author | Han, QL | - |
dc.date.accessioned | 2021-11-03T19:00:46Z | - |
dc.date.available | 2021-11-03T19:00:46Z | - |
dc.date.issued | 2020-08-14 | - |
dc.identifier.citation | Ma, L., Wang, Z., Hu, J. and Han, Q.-L. (2021) 'Probability-Guaranteed Envelope-Constrained Filtering for Nonlinear Systems Subject to Measurement Outliers,' IEEE Transactions on Automatic Control, 66 (7), pp. 3274 - 3281. doi: 10.1109/TAC.2020.3016767. | en_US |
dc.identifier.issn | 0018-9286 | - |
dc.identifier.uri | https://bura.brunel.ac.uk/handle/2438/23445 | - |
dc.description.sponsorship | 10.13039/501100001809-National Natural Science Foundation of China (Grant Number: 61773209, 61873148, 61933007 and 61673141); Australian Research Council Discovery Project (Grant Number: DP160103567); 10.13039/501100004608-Natural Science Foundation of Jiangsu Province (Grant Number: BK20190021); 10.13039/501100010014-Six Talent Peaks Project in Jiangsu Province (Grant Number: XYDXX-033); Alexander von Humboldt Foundation of Germany. | en_US |
dc.format.extent | 3274 - 3281 | - |
dc.format.medium | Print-Electronic | - |
dc.language.iso | en_US | en_US |
dc.publisher | IEEE | en_US |
dc.rights | © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | - |
dc.subject | nonlinear systems | en_US |
dc.subject | measurement outliers | en_US |
dc.subject | H∞ filtering | en_US |
dc.subject | envelope-constraint in probability | en_US |
dc.subject | finite-horizon filtering | en_US |
dc.title | Probability-Guaranteed Envelope-Constrained Filtering for Nonlinear Systems Subject to Measurement Outliers | en_US |
dc.type | Article | en_US |
dc.identifier.doi | https://doi.org/10.1109/TAC.2020.3016767 | - |
dc.relation.isPartOf | IEEE Transactions on Automatic Control | - |
pubs.issue | 7 | - |
pubs.publication-status | Published | - |
pubs.volume | 66 | - |
dc.identifier.eissn | 1558-2523 | - |
Appears in Collections: | Dept of Computer Science Research Papers |
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FullText.pdf | © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | 789.86 kB | Adobe PDF | View/Open |
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