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http://bura.brunel.ac.uk/handle/2438/19232Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Bai, X | - |
| dc.contributor.author | Wang, Z | - |
| dc.contributor.author | Zou, L | - |
| dc.contributor.author | Cheng, C | - |
| dc.date.accessioned | 2019-10-04T11:36:08Z | - |
| dc.date.available | 2018-03-09 | - |
| dc.date.available | 2019-10-04T11:36:08Z | - |
| dc.date.issued | 2018-03-09 | - |
| dc.identifier.citation | IEEE Transactions on Industrial Electronics, 2018, 65 (12), pp. 9687 - 9697 | en_US |
| dc.identifier.issn | 0278-0046 | - |
| dc.identifier.issn | http://dx.doi.org/10.1109/TIE.2018.2813982 | - |
| dc.identifier.uri | http://bura.brunel.ac.uk/handle/2438/19232 | - |
| dc.description | © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | en_US |
| dc.description.sponsorship | Research Fund for the Taishan Scholar Project of Shandong Province of China; the National Natural Science Foundation of China; the Royal Society of the U.K, Alexander von Humboldt Foundation of Germany | en_US |
| dc.format.extent | 9687 - 9697 | - |
| dc.language.iso | en | en_US |
| dc.publisher | IEEE | en_US |
| dc.rights | © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | en_US |
| dc.subject | Degraded measurement | en_US |
| dc.subject | Quantization | en_US |
| dc.subject | Recursive filtering | en_US |
| dc.subject | Target tracking | en_US |
| dc.subject | Wireless localization system | en_US |
| dc.title | Target Tracking for Wireless Localization Systems with Degraded Measurements and Quantization Effects | en_US |
| dc.type | Article | en_US |
| dc.identifier.doi | http://dx.doi.org/10.1109/TIE.2018.2813982 | - |
| dc.relation.isPartOf | IEEE Transactions on Industrial Electronics | - |
| pubs.issue | 12 | - |
| pubs.publication-status | Published | - |
| pubs.volume | 65 | - |
| Appears in Collections: | Dept of Computer Science Research Papers | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| FullText.pdf | © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | 1.91 MB | Adobe PDF | View/Open |
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