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Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/19195
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dc.contributor.authorAl-Hmood, H-
dc.contributor.authorAl-Raweshidy, H-
dc.date.accessioned2019-09-27T13:23:58Z-
dc.date.available2019-09-27T13:23:58Z-
dc.date.issued2019-12-01-
dc.identifier.citationAl-Hmood, H. and Al-Raweshidy, H.S. (2019) 'Exact closed-form capacity and outage probability of physical layer security in κ−µ shadowed fading channels', IET Communications, 13 (19), pp. 3235-3243. doi: 10.1049/iet-com.2019.0325.en_US
dc.identifier.issn1751-8628-
dc.identifier.urihttps://bura.brunel.ac.uk/handle/2438/19195-
dc.format.mediumPrint-Electronic-
dc.language.isoenen_US
dc.publisherWiley on behalf of The Institution of Engineering and Technology-
dc.rightsThis paper is a postprint of a paper submitted to and accepted for publication in IET Communications and is subject to Institution of Engineering and Technology Copyright. The copy of record is available at the IET Digital Library".en_US
dc.rightsThis paper is a postprint of a paper submitted to and accepted for publication in IET Communications and is subject to Institution of Engineering and Technology Copyright. The copy of record is available at the IET Digital Library [now on Wiley Online Library].-
dc.subjectMonte Carlo methods-
dc.subjectprobability-
dc.subjecttelecommunication security-
dc.subjecttelecommunication network reliability-
dc.subjectfading channels-
dc.subjectchannel capacity-
dc.subjectmultipath clusters-
dc.subjectinteger numbers-
dc.subjectclosed-form mathematically tractable expressions-
dc.subjectexact closed-form capacity-
dc.subjectphysical layer security-
dc.subjectshadowed fading channels-
dc.subjectwiretap channels-
dc.subjectsecure outage probability-
dc.titleExact closed-form capacity and outage probability of physical layer security in κ−µ shadowed fading channelsen_US
dc.typeArticleen_US
dc.identifier.doihttps://doi.org/10.1049/iet-com.2019.0325-
dc.relation.isPartOfIET Communications-
pubs.publication-statusPublished-
dc.identifier.eissn1751-8636-
Appears in Collections:Dept of Electronic and Electrical Engineering Research Papers

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