Testing of mixed-signal systems using dynamic stimuli

Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/1801

Full metadata record

DC Field	Value	Language
dc.contributor.author	Taylor, D	-
dc.contributor.author	Evans, PSA	-
dc.contributor.author	Pritchard, TI	-
dc.coverage.spatial	3	en
dc.date.accessioned	2008-03-07T15:52:11Z	-
dc.date.available	2008-03-07T15:52:11Z	-
dc.date.issued	1993	-
dc.identifier.citation	IEE Electronics Lttrs Vol.29, No.9, April 1993. pp 811 - 813.	en
dc.identifier.issn	0013-5194	-
dc.identifier.uri	http://bura.brunel.ac.uk/handle/2438/1801	-
dc.description.abstract	The impulse response of a linear circuit element contains enough information to functionally characterise that element. A technique for comparison of observed and expected (reference) transient responses, which results in an absolute measure of device functionality, is presented. Comparisons of transient response test results with the results from existing test programs are also presented.	en
dc.format.extent	318414 bytes	-
dc.format.mimetype	application/pdf	-
dc.language.iso	en	-
dc.publisher	IEEE	en
dc.subject	Integrated circuits; Testing	en
dc.title	Testing of mixed-signal systems using dynamic stimuli	en
dc.type	Research Paper	en
Appears in Collections:	Design Brunel Design School Research Papers

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