Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/12315
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dc.contributor.authorMajidnia, S-
dc.contributor.authorNilavalan, R-
dc.contributor.authorRudlin, J-
dc.date.accessioned2016-03-10T12:46:47Z-
dc.date.available2016-03-01-
dc.date.available2016-03-10T12:46:47Z-
dc.date.issued2016-
dc.identifier.citationInsight: Non-Destructive Testing and Condition Monitoring Journal, 58(3): pp. 129-134, (2016)en_US
dc.identifier.issn1354-2575-
dc.identifier.urihttp://www.bindt.org/publications/insight-journal/This-months-Insight/-
dc.identifier.urihttp://bura.brunel.ac.uk/handle/2438/12315-
dc.description.abstractThe simple standard depth of penetration equation used for most eddy current calculations does not take into account the effects of the size and type of the coil, the lift-off or the specimen thickness. The work described in this paper includes a study of the depth of penetration of eddy currents for different coil sizes including surface and encircling type coils by taking advantage of the sophisticated finite element modelling software COMSOL. Knowledge of these effects plays an important role in designing eddy current coils and examinations of conductive materials with the eddy current technique. This paper includes a study of the effects of all the dimensions of a surface coil, encircling coil, lift-off and specimen thickness at several excitation frequencies. It is demonstrated from the results obtained from these numerical studies that the coil parameters affect the depth of penetration at different frequencies.en_US
dc.language.isoenen_US
dc.publisherThe British Institute of Non-Destructive Testingen_US
dc.subjectStandard depth of penetrationen_US
dc.subjectEddy current testingen_US
dc.subjectFinite element analysisen_US
dc.titleA numerical study of the depth of penetration of eddy currentsen_US
dc.typeArticleen_US
dc.relation.isPartOfInsight: Non-Destructive Testing and Condition Monitoring Journal-
pubs.issue3-
pubs.publication-statusAccepted-
pubs.publication-statusAccepted-
pubs.volume58-
Appears in Collections:Dept of Electronic and Electrical Engineering Research Papers

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