Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/10787
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dc.contributor.authorSamano, A-
dc.contributor.authorXu, Y-
dc.contributor.authorHarrison, D-
dc.contributor.authorHunt, C-
dc.contributor.authorWickham, M-
dc.contributor.authorThomas, O-
dc.date.accessioned2015-05-08T15:35:05Z-
dc.date.available2014-12-18-
dc.date.available2015-05-08T15:35:05Z-
dc.date.issued2014-
dc.identifier.citationProceedings of 3rd Asia-Pacific Conference on Antennas and Propagation, APCAP 2014: 889 - 891, Harbin, (26-29 July 2014)en_US
dc.identifier.isbn9781479943548-
dc.identifier.urihttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6992642-
dc.identifier.urihttp://bura.brunel.ac.uk/handle/2438/10787-
dc.description.abstractThe purpose of this research paper is to investigate the defects detecting technique in printed electronics by the third harmonic measurements. Various types of defects were introduced on the samples and the third harmonic signal was measured using a component linearity tester (Radiometer CLT1). The relationship between the defects in the printed samples and the third harmonic signal and the third harmonic ratio was identified.en_US
dc.format.extent889 - 891-
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.subjectDefect detectionen_US
dc.subjectPrinted electronicsen_US
dc.subjectReliability testingen_US
dc.subjectThird harmonic indexen_US
dc.titleThird harmonic measurement in printed electronicsen_US
dc.typeConference Paperen_US
dc.identifier.doihttp://dx.doi.org/10.1109/APCAP.2014.6992642-
dc.relation.isPartOfProceedings of 3rd Asia-Pacific Conference on Antennas and Propagation, APCAP 2014-
Appears in Collections:Brunel Design School Research Papers

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