New method of vapour discrimination using the Thickness Shear Mode (TSM) resonator

Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/10723

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DC Field	Value	Language
dc.contributor.author	Holloway, AF	-
dc.contributor.author	Nabok, A	-
dc.contributor.author	Thompson, M	-
dc.contributor.author	Ray, AK	-
dc.contributor.author	Crowther, D	-
dc.contributor.author	Siddiqi, J	-
dc.date.accessioned	2015-05-01T13:15:36Z	-
dc.date.available	2003-06	-
dc.date.available	2015-05-01T13:15:36Z	-
dc.date.issued	2003	-
dc.identifier.citation	SENSORS, 2003, 3 (6), pp. 187 - 191	en_US
dc.identifier.issn	1424-8220	-
dc.identifier.uri	http://bura.brunel.ac.uk/handle/2438/10723	-
dc.description.abstract	The Impedance analysis technique complemented with curve fitting software was used to monitor changes in film properties of Thickness Shear Mode (TSM) resonator on vapour exposure. The approach demonstrates how sensor selectivity can be achieved through unique changes in film viscosity caused by organic vapour adsorption.	en_US
dc.format.extent	187 - 191	-
dc.language	EN	-
dc.language.iso	en	en_US
dc.publisher	MOLECULAR DIVERSITY PRESERVATION INTERNATIONAL	en_US
dc.subject	Impedance analysis	en_US
dc.subject	QCM	en_US
dc.subject	TSM resonator	en_US
dc.subject	BVD model	en_US
dc.subject	Films	en_US
dc.title	New method of vapour discrimination using the Thickness Shear Mode (TSM) resonator	en_US
dc.type	Article	en_US
dc.relation.isPartOf	SENSORS	-
pubs.issue	6	-
pubs.issue	6	-
pubs.volume	3	-
pubs.volume	3	-
Appears in Collections:	Wolfson Centre for Sustainable Materials Development and Processing

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